DRA Component Services Inc.
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Facilities Listing
     Tape and Reeling
     Dry Packaging
     Memory Testing
     Digital Testing
     Linear Testing
     Discrete Testing
     Relay Testing
     Crystal Testing
     Passive Testing
     Programming
     UV Erasure
     Labeling
     Temperature Testing
     Burn-In Capabilities
     Temperature Cycling Air To Air
     Gross Leak Testing
     Particle Impact Noise Detection
    
Testing Services
     Quality Compliance
     Equivalent Testing To
     Electrical Testing/Burn-In
     Environmental Testing
     Custom Services

 

NOW OFFERING TAPE AND REEL

Tape and Reel - Q-Corp QMT-1100D

Counter - Q-Corp QC-100

Vacuum Sealer - Amerivacs AVS-20

 

Facilities Listing
Tape and Reel & Dry Packaging
  • Tape and Reel - Q-Corp QMT-1100D
  • Counter - Q-Corp QC-100
  • Vacuum Seal - Amerivacs AVS-20
  • Dry Packaging
Memory Testing
  • Darkhorse Systems Sigma II dc parametric performed of DRAM devices
  • Darkhorse Systems Sigma LC functional testing of DRAM
Digital Testing
  • Logue McDonald LMO500 - 384 I/O-100MHz
  • Gen Rad 1732M Test Systems dc and parametric measurements
  • Logue McDonald 324B-5 Test Systems - dc and parametric measurements along w/propagation delays
Linear Testing
  • Analog Devices LTS2020
  • Analog Devices LTS2010 - Parametric and functional testing capabilities for linear device such as Op Amps, Comparators, Regulators, DAC's and ADC's
Discrete Testing
  • Scientific Test 5150 Test Systems with High Voltage and High Current capability
  • Scientific Test 5300 Test Systems with Low Current capability and multiple section DUT scanner deck - ability to record pre and post burn-in measurements - deltas calculated
Relay Testing
  • Markenrich RT160 Relay Tester
Crystal Testing
  • Saunders & Associates 250A Crystal Test System
Passive Testing
  • Gen Rad 1689 RLC Digibridge Test System
  • Gen Rad 1687 BLC Digibridge Test System
  • Gen Rad 1684 Megohmmeter
Programming
  • Digital I/O Unisite Systems - Variety of fixtures for a large assortment of devices
  • Data I/O PSX1000 Parallel Programmer-capabilities to program up to 10 devices at a time
  • BP Micro BP1400/84
UV Erasure
  • UVEProm Erasing Cabinet
Labeling
  • Brady Printer TMT 200M assortment of labels for all types of packages -- kapton labels for high temperature applications
Temperature Testing
  • Temptronics TP04000 Series Thermostream -65C to 200C
  • Thermonics T2420SX-7 Temperature Forcing Systems capability of device environment of -65C to 200C
  • Thermonics T-2820 Precision Temperature Forcing System -65C to 200C
Burn-In Capabilities
  • Liner
  • Digital
  • Discrete
    • Despatch PBC2-16
    • Blue M
    • Capability to perform static on a variety of packages from standard diodes to complex BGA. Dynamic performed at customer request
Temperature Cycling Air To Air
  • Blue M WSP 109B3X16 capable of automatic transfer to satisfy MIL-STD-883 Method 1010 and MIL-STD-750 Method 1051
Gross Leak Testing
  • Trio-Tech 481 Test Systems
Particle Impact Noise Detection (PIND)
  • Dunegan/Endevco 4501A capability to satisfy MIL-STD-883 Method 2020 and MIL-STD-750 Method 2052
    
Testing Services
Quality Compliance
  • ISO 9001:2008
  • MIL-I-45208
Equivalent Testing To
  • MIL-M-38510
  • MIL-PRF-38535
  • MIL-PRF-19500
  • MIL-STD-202
  • MIL-STD-750
  • MIL-STD-883
  • MIL-STD-981
  • MIL-HDBK-454
Electrical Testing/Burn-In

DRA has an extensive test program library with capabilities for AC, DC parametric and functional evaluation and testing of a wide variety of devices ranging from diodes and transistors to more complex linear, LSI, VLSI technologies, as well as complete bench test set-ups for non-standard parameters and passive components. Static/Dynamic Burn-In with positions are available for most package styles.

  • UP SCREENING - INDUSTRIAL TEMPERATURE
  • AC PARAMETRICS
  • BURN-IN
  • LIFE TESTING
  • READ & RECORD
  • GO/NO-GO
  • PRE & POST ELECTRICAL
  • MEMORY TESTING
  • COMPARATIVE ANALYSIS
Environmental Testing
  • SOLDERABILITY/TINNING
  • STABILIZATION BAKE
  • HUMIDITY TESTING
  • TEMPERATURE CYCLE
  • CENTRIFUGE
  • HERMETICITY (FINE/GROSS LEAK)
  • PARTICLE IMPACT NOISE DETECTION (PIND)
Custom Services
  • DEVICE PROGRAMMING & ERASURE
  • MARKING
  • BAR CODING
  • DPA/FAILURE ANALYSIS
  • SELECTION TESTING
  • ENGINEERING EVALUATION
 
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